Donetsk National Technical University
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https://ea.donntu.edu.ua/jspui/handle/123456789/4370| Title: | Метод параллельной генерации тестов на переключательном уровне для МОП-схем |
| Authors: | Андрюхин, Александр Иванович Andruckin, Alexandr Ivanovich |
| Keywords: | switch level CMOS diagnosis test random |
| Issue Date: | Jan-2011 |
| Publisher: | Electronic Modeling |
| Abstract: | À method for pseudorandom test generation on switch level is described. Experimental results of investigation on Iscas-89 circuits are presented to demonstrate the ef fectiveness of the proposed method. |
| URI: | http://ea.donntu.edu.ua/handle/123456789/4370 |
| ISSN: | 0204–3572 |
| Appears in Collections: | Персональні архіви докторантів кафедри Статті співробітників кафедри ПМІ |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Andruckin_ISSN_0204–3572_ Electronic Modeling_ 2011_ V_ 33_1.pdf | 147,57 kB | Adobe PDF | View/Open |
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