Please use this identifier to cite or link to this item: http://ea.donntu.edu.ua:8080/jspui/handle/123456789/4370
Title: Метод параллельной генерации тестов на переключательном уровне для МОП-схем
Authors: Андрюхин, Александр Иванович
Andruckin, Alexandr Ivanovich
Keywords: switch
level
CMOS
diagnosis
test
random
Issue Date: Jan-2011
Publisher: Electronic Modeling
Abstract: À method for pseudorandom test generation on switch level is described. Experimental results of investigation on Iscas-89 circuits are presented to demonstrate the ef fectiveness of the proposed method.
URI: http://ea.donntu.edu.ua/handle/123456789/4370
ISSN: 0204–3572
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