Donetsk National Technical University
Please use this identifier to cite or link to this item:
https://ea.donntu.edu.ua/jspui/handle/123456789/15864| Title: | КОМПАКТНОЕ ТЕСТИРОВАНИЕ НА ОСНОВЕ ЧЕТЫРЕХЗНАЧНОЙ ЛОГИКИ |
| Other Titles: | Compact testing on the basis four-valued logic. |
| Authors: | Дяченко, О.Н. Герасимов, А.Н. Djаchenko, O.N. Gerasimov, A.N. |
| Keywords: | linear shift feedback registers four-valued logic компактное тестирование четырехзначная логика цифровые кругообороты |
| Issue Date: | 1997 |
| Publisher: | ДонНТУ |
| Citation: | Наукові праці Донецького національного технічного університету, серія «Інформатика, кібернетика та обчислювальна техніка»,випуск 1, Донецк, ДонНТУ, 1997 |
| Description: | Problems on the using of linear shift feedback registers (LSFR) based on four-valued logic for compact testing digital circuits are considered. The algorithm for determination of primitive polynomials on GF(4) is suggested. A table of some primitive polynomials on GF(4) is presented. The advantages of LSFR GF(4) as compared with LSFR GF(2) is described The obtained results may be of use to self-testig circuit design, compact testing built-in testing of digital circuits on the basis two-valued as well as four-valued logic. |
| URI: | http://ea.donntu.edu.ua/handle/123456789/15864 |
| Appears in Collections: | Випуск 1 |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 193-197.pdf | 3,55 MB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.