Donetsk National Technical University
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https://ea.donntu.edu.ua/jspui/handle/123456789/1453| Title: | Evolutionary approach to the functional test generation for digital circuits |
| Authors: | Ivanov, Dmitry Skobtsov, Yurij Skobtsov, Vadim Ubar, Raimond |
| Keywords: | digital circuit genetic algorithm sequential circuits BIST test generation functional approach |
| Issue Date: | 2004 |
| Publisher: | Proc. of 9th Biennial Baltic Electronics Conf., BEC 2004 |
| Citation: | Y. A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, R. Ubar. Evolutionary approach to the functional test generation for digital circuits. In Proc. of 9th Biennial Baltic Electronics Conf., BEC 2004 (Tallinn, Oct. 2004), pp. 229-232. Tallinn Univ. of Techn., 2004. |
| Abstract: | In the paper an evolutionary approach for functional testing of digital circuits is considered. A genetic algorithm for testing digital multiplier is proposed. The main target of the proposed method is to generate as short as possible functional test wih as high as possible fault coverage with the goal to use the generated patterns as the input data for embedded functional BIST. Experimental data of the program realization is also represented. |
| URI: | http://ea.donntu.edu.ua/handle/123456789/1453 |
| Appears in Collections: | Наукові статті кафедри автоматизованих систем управління |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| bec2004.pdf | 161,04 kB | Adobe PDF | View/Open |
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