Donetsk National Technical University
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https://ea.donntu.edu.ua/jspui/handle/123456789/1449| Title: | Distributed Genetic Algorithm of Test Generation For Digital Circuits |
| Authors: | Ivanov, Dmitry Skobtsov, Yurij El-Khatib |
| Keywords: | genenic algorithms distributed calculations test generation fault simulation digital circuits |
| Issue Date: | 2006 |
| Publisher: | Proceedings of the 10th Biennial Baltic Electronics Conference. |
| Citation: | Skobtsov Y.A., El-Khatib, Ivanov D.E. Distributed Genetic Algorithm of Test Generation For Digital Circuits // Proceedings of the 10th Biennial Baltic Electronics Conference.-Tallinn Technical University,2006.-p.281-284. |
| Abstract: | The distributed genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation. |
| URI: | http://ea.donntu.edu.ua/handle/123456789/1449 |
| Appears in Collections: | Наукові статті кафедри автоматизованих систем управління |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| skobtsov-bec2006.pdf | 194,45 kB | Adobe PDF | View/Open |
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