Evolutionary distributed test generation methods for digital circuits

Please use this identifier to cite or link to this item: https://ea.donntu.edu.ua/jspui/handle/123456789/1445

Full metadata record

DC Field	Value	Language
dc.contributor.author	Ivanov, Dmitry	-
dc.contributor.author	Skobtsov, Vadim	-
dc.contributor.author	Skobtsov, Yurij	-
dc.date.accessioned	2011-10-12T06:51:49Z	-
dc.date.available	2011-10-12T06:51:49Z	-
dc.date.issued	2008	-
dc.identifier.citation	Y.A. Skobtsov, D.E. Ivanov, V.Y. Skobtsov Evolutionary distributed test generation methods for digital circuits // Proc. of 8th International Workshop on Boolean Problems, September 18-19, 2008, Freiberg, Germany.- pp.213-218.	en_US
dc.identifier.uri	http://ea.donntu.edu.ua/handle/123456789/1445	-
dc.description.abstract	The genetic algorithms of test generation and fault simulation for digital circuits are considered. The main modes of genetic algorithm parallelization for test generation and simulation are represented - “worker-farmer”, “island model”. The program implementation and computer experiments of proposed methods are discussed.	en_US
dc.language.iso	en	en_US
dc.publisher	Proc. of 8th International Workshop on Boolean Problems, September 18-19, 2008, Freiberg, Germany	en_US
dc.subject	evolutionary computations	en_US
dc.subject	genetic algorithm	en_US
dc.subject	sequential circuits	en_US
dc.subject	test generation	en_US
dc.subject	parallel algorithm	en_US
dc.subject	islands model	en_US
dc.title	Evolutionary distributed test generation methods for digital circuits	en_US
dc.type	Article	en_US
Appears in Collections:	Наукові статті кафедри автоматизованих систем управління

Files in This Item:

File	Description	Size	Format
Distributed evolutionary test generation.pdf		104,8 kB	Adobe PDF	View/Open

Donetsk National Technical University