Donetsk National Technical University
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https://ea.donntu.edu.ua/jspui/handle/123456789/1445| Title: | Evolutionary distributed test generation methods for digital circuits |
| Authors: | Ivanov, Dmitry Skobtsov, Vadim Skobtsov, Yurij |
| Keywords: | evolutionary computations genetic algorithm sequential circuits test generation parallel algorithm islands model |
| Issue Date: | 2008 |
| Publisher: | Proc. of 8th International Workshop on Boolean Problems, September 18-19, 2008, Freiberg, Germany |
| Citation: | Y.A. Skobtsov, D.E. Ivanov, V.Y. Skobtsov Evolutionary distributed test generation methods for digital circuits // Proc. of 8th International Workshop on Boolean Problems, September 18-19, 2008, Freiberg, Germany.- pp.213-218. |
| Abstract: | The genetic algorithms of test generation and fault simulation for digital circuits are considered. The main modes of genetic algorithm parallelization for test generation and simulation are represented - “worker-farmer”, “island model”. The program implementation and computer experiments of proposed methods are discussed. |
| URI: | http://ea.donntu.edu.ua/handle/123456789/1445 |
| Appears in Collections: | Наукові статті кафедри автоматизованих систем управління |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Distributed evolutionary test generation.pdf | 104,8 kB | Adobe PDF | View/Open |
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