Please use this identifier to cite or link to this item: http://ea.donntu.edu.ua:8080/jspui/handle/123456789/9448
Title: THE DISTINGUISHING FUNCTIONS IN TEST GENERATION OF DIGITAL SEQUENTIAL CIRCUITS WITH MULTIPLE OBSERVATION TIME STRATEGY
Authors: Скобцов, Юрий Александрович
Скобцов, Вадим Юрьевич
Keywords: sequential circuits
test generation
distinguishing function
multiple observation time strategy
Issue Date: May-2011
Publisher: ХАИ
Citation: Yuriy Skobtsov, Vadim Skobtsov.THE DISTINGUISHING FUNCTIONS IN TEST GENERATION OF DIGITAL SEQUENTIAL CIRCUITS WITH MULTIPLE OBSERVATION TIME STRATEGY//Proceedings of 1-st International Workshop "Critical infrastructur safety and security"(CrISS-DESERT'2011).-Vol.2.-P.441-450
Abstract: An analytical approach is considered to test generation for circuits with memory which is based on method of the distinguishing functions. It uses the symbolic simulation and multiple observation time strategy of output signals, which can improve the fault coverage of test. We consider two forms of distinguishing function – disjunctive and conjunctive. Disjunctive form identifies distinguishable state pairs of good and faulty circuits and reduces the problem of test generation to verifying tautologies of distinguishing function. Conjunctive form determines the pairs of indistinguishable states and reduces the problem of test generation to satisfiability of Boolean functions problem (SAT).
Description: An analytical approach is considered to test generation for circuits with memory which is based on method of the distinguishing functions. It uses the symbolic simulation and multiple observation time strategy of output signals, which can improve the fault coverage of test. We consider two forms of distinguishing function – disjunctive and conjunctive. Disjunctive form identifies distinguishable state pairs of good and faulty circuits and reduces the problem of test generation to verifying tautologies of distinguishing function. Conjunctive form determines the pairs of indistinguishable states and reduces the problem of test generation to satisfiability of Boolean functions problem (SAT).
URI: http://ea.donntu.edu.ua/handle/123456789/9448
ISBN: 978-966-662-227-6
Appears in Collections:Наукові статті кафедри автоматизованих систем управління

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