Please use this identifier to cite or link to this item: http://ea.donntu.edu.ua:8080/jspui/handle/123456789/1453
Title: Evolutionary approach to the functional test generation for digital circuits
Authors: Ivanov, Dmitry
Skobtsov, Yurij
Skobtsov, Vadim
Ubar, Raimond
Keywords: digital circuit
genetic algorithm
sequential circuits
BIST
test generation
functional approach
Issue Date: 2004
Publisher: Proc. of 9th Biennial Baltic Electronics Conf., BEC 2004
Citation: Y. A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, R. Ubar. Evolutionary approach to the functional test generation for digital circuits. In Proc. of 9th Biennial Baltic Electronics Conf., BEC 2004 (Tallinn, Oct. 2004), pp. 229-232. Tallinn Univ. of Techn., 2004.
Abstract: In the paper an evolutionary approach for functional testing of digital circuits is considered. A genetic algorithm for testing digital multiplier is proposed. The main target of the proposed method is to generate as short as possible functional test wih as high as possible fault coverage with the goal to use the generated patterns as the input data for embedded functional BIST. Experimental data of the program realization is also represented.
URI: http://ea.donntu.edu.ua/handle/123456789/1453
Appears in Collections:Наукові статті кафедри автоматизованих систем управління

Files in This Item:
File Description SizeFormat 
bec2004.pdf161,04 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.