Please use this identifier to cite or link to this item: http://ea.donntu.edu.ua:8080/jspui/handle/123456789/1449
Title: Distributed Genetic Algorithm of Test Generation For Digital Circuits
Authors: Ivanov, Dmitry
Skobtsov, Yurij
El-Khatib
Keywords: genenic algorithms
distributed calculations
test generation
fault simulation
digital circuits
Issue Date: 2006
Publisher: Proceedings of the 10th Biennial Baltic Electronics Conference.
Citation: Skobtsov Y.A., El-Khatib, Ivanov D.E. Distributed Genetic Algorithm of Test Generation For Digital Circuits // Proceedings of the 10th Biennial Baltic Electronics Conference.-Tallinn Technical University,2006.-p.281-284.
Abstract: The distributed genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation.
URI: http://ea.donntu.edu.ua/handle/123456789/1449
Appears in Collections:Наукові статті кафедри автоматизованих систем управління

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