Please use this identifier to cite or link to this item: http://ea.donntu.edu.ua:8080/jspui/handle/123456789/1445
Title: Evolutionary distributed test generation methods for digital circuits
Authors: Ivanov, Dmitry
Skobtsov, Vadim
Skobtsov, Yurij
Keywords: evolutionary computations
genetic algorithm
sequential circuits
test generation
parallel algorithm
islands model
Issue Date: 2008
Publisher: Proc. of 8th International Workshop on Boolean Problems, September 18-19, 2008, Freiberg, Germany
Citation: Y.A. Skobtsov, D.E. Ivanov, V.Y. Skobtsov Evolutionary distributed test generation methods for digital circuits // Proc. of 8th International Workshop on Boolean Problems, September 18-19, 2008, Freiberg, Germany.- pp.213-218.
Abstract: The genetic algorithms of test generation and fault simulation for digital circuits are considered. The main modes of genetic algorithm parallelization for test generation and simulation are represented - “worker-farmer”, “island model”. The program implementation and computer experiments of proposed methods are discussed.
URI: http://ea.donntu.edu.ua/handle/123456789/1445
Appears in Collections:Наукові статті кафедри автоматизованих систем управління

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