1. Електронний архів ДонНТУ м.Покровськ

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Issue DateTitleAuthor(s)
2006Distributed Genetic Algorithm of Test Generation For Digital CircuitsIvanov, Dmitry; Skobtsov, Yurij; El-Khatib
2004Evolutionary approach to the functional test generation for digital circuitsIvanov, Dmitry; Skobtsov, Yurij; Skobtsov, Vadim; Ubar, Raimond
2006Distributed Fault Simulation and Genetic Test Generation of Digital CircuitsIvanov, Dmitry; Skobtsov, Yurij; El-Khatib
2008Evolutionary distributed test generation methods for digital circuitsIvanov, Dmitry; Skobtsov, Vadim; Skobtsov, Yurij

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